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Home > Product Introduction > Tester

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ENLT-1000  LED Tester@
ECUSTOM   Customized Tester@


YAC Garter Products Guide


  NLT-1000
LED Tester@ 

 LED tester, in connection with sorting machine, can measure characteristics of LED (electrical & optical characters) at high precision, high resolution & high speed and sort.

@Specification
Measurement object 3chips
Measurement station 1stage
Station addition is option
Measurement items Electric Item Polarity check
VF,VR,IF,IR
Optical itemFIV,p,d, x, y,CCT,Ra
Special measurement is available
Number of
 measurement items
Max. 32 items
Optical device Hamamatsu PhotonicsFPMA12
Otsuka ElectronicsFLE5400
Other optical device is available
Number of classifications Max. 256 classifications
Impressed voltage 0`20V
30Vspecification is option
Impressed current 0`500mA
Up to 3A specification is available
Language Japanese, English
Others Output format:FCSV format
Self- test function
Form control by using bar-codes
Connection with server
Available upon request

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  Customized Tester
 EIC Tester                  
 EOrganic EL Tester
 EESD Tester

yIC Testerz
 With a data communication through an I2C and SPI communication by microcomputer as an I/F an IC tester enables acceptance/rejection judgement for sensors and ICs by synthetic detail checking of characteristics and consumption@current in a PC.

@Application-P
Measuring object MEMS
Measurement station 1 Station
Measurement item Reading out of device informationiSPIj
Comprehensive check and acceptance/rejection judgement of data base
Number of classifications Q classifications
Others Output formatFbru format
Barcode system
DATA Linkage with a high order serer
@Application-2
Measuring object Optical sensor
Measurement station T Stations
Measurement item Reading out of optical dataiI2Cj
Acceptance/Rejection judgement from 5 stations data
Number of classifications T classifications
Others Output formatFbru format
Barcode system
DATA Linkage with a high order serer

yOrganic EL Testerz
 Optical characteristics by a spectrometer and an electric characteristics by SMU (Source Measure Unit) with GP-IB control enables a high speed measurement and classification.

@Application-3
Measuring object OLED
Measurement station Q Stations
Measurement item Electric itemFVF,IR
Optical itemFBrightness,p,d, x, y,CCT,Ra
Number of classifications T classifications
Others Output formatFbru format
DATA Linkage with a high order serer
@Application-4
Measuring object OLED
Measurement station T Stations
Measurement item Electric itemF Leakage measurement
Others Output formatFbru format
DATA Linkage with a high order serer

yESD Testerz
 Mounting a tester on a machine enables an high speed ESD application

@Application-5
Measurement terminal Q terminals(Kelvin contact available)
Discharging model HumanBodyModelFHBM
Voltage 0u`4000V
Number of ESD application time Max. 100 times
Charge and Discharge times 10ms
Applicable standards JEITA@EIAJ@ED-4701/300 Testing method304
JEDEC@22a114D

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The specification of the product might change without a previous  notice.
Please note that the picture of products may be different from actual  ones depending on shooting & printing conditions.
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